PiFM/AFM-IR Nano Chemical Imaging AFM
PiFM method AFM that visualizes chemical composition with nanometer resolution while observing shape.
This is a series of AFM-IR devices that adopt the light-induced force (PiFM) method. By detecting the light-induced force acting between the probe and the sample, it has achieved chemical mapping and point spectrum acquisition with spatial resolution surpassing that of FTIR and nano-FTIR. - It has single-molecule level surface sensitivity, visualizing the chemical composition of materials regardless of whether they are organic or inorganic. - Measurements are conducted in a non-contact and non-destructive manner, keeping both the sample and the tip in a clean state. - By correlating with existing FTIR spectra, materials can be identified from the acquired spectra. - The design maintains optical alignment even after sample exchange. - It accommodates a wide range of fields, including semiconductors, polymers, inorganic materials, and nanophotonics. - Multiple models are available for selection, differing in installation space, sample size, and level of automation. We will propose the optimal configuration according to your application and installation environment.
- Company：日本レーザー
- Price：Other
